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Progress in Earth and Planetary Science
Fig. 7 | Progress in Earth and Planetary Science

Fig. 7

From: Depth profile of frictional properties in the inner Nankai accretionary prism using cuttings from IODP Site C0002

Fig. 7

Back-scattered electron images of the recovered samples A C0002N-141SW and B C0002P-266SW. The gouge layer is sandwiched between the gabbro forcing blocks, and the arrows in the blocks indicate slip directions. Riedel shears are widely developed in these samples. These images were taken using an electron-probe microanalyzer with a 15-kV accelerating voltage and 2.5 nA probe current

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