Fig. 6

a STEM image of the ultra-thin section of graphite cut by FIB. The top of the STEM image is the polished surface, which is covered by a coating of platinum and carbon. b Bright field (BF) TEM image of an ultra-thin section of graphite as cut by FIB. The white circles show the location of spots of the SAED patterns within the measured areas in (c) to (g). c The SAED pattern of the bottom part of the graphite sheet under the flat part shows clear 100 and 001 spots. d The SAED pattern of the area ~ 1.5 μm below the flat part shows clear 100 and 001 spots. e The SAED pattern of the highly fractured zone in the flat part exhibits 100 and 001 spots. f The SAED pattern of the area under the grooved band showing weak 002 spots. g The SAED pattern of the area under a different grooved band indicate weak 002 spots